Duda, Richard O. <br/><br/>
Pattern classification 

 - 2nd ed. 
 - Nueva York :  ,  c2001 
 - xx, 654 p. :  il. col.  ;  26 cm. 
<br/><br/> Incluye bibliografía, problemas y ejercicios. -- 
<br/><br/>Bayesian decision theory -- Maximum-Likelihood and Bayesian parameter estimation -- Nonparametric techniques -- Linear discriminant functions -- Multilayer neural networks -- Stochastic methods -- Nonmetric methods -- Algorithm-independent machine learning -- Unsupervised learning and clustering -- App. Mathematical foundations. 
<br/><br/><label>ISBN: </label>0471056693 
<br/><br/><label>Standard No.: </label>DIF001506 
<br/><br/><label>Subjects--Topical Terms: </label><br/>RECONOCIMIENTO DE PATRONES